The supporting dataset of the thesis named "Top electrode and interfacial engineering for high-performance photovoltaics". The related data contains SEM, TEM, and AFM images which is conducted during the research experiment. The morphology of the device and materials can directly prove the related statements in the thesis. The surface morphology of the AgNP films before and after annealing is characterized by scanning electron microscopy (SEM, Hitachi S4800 FEG), transmission electron microscopy (TEM, Philips Tecnai G2 20 S-TWIN), and atomic force microscopy (AFM, NT-MDT NTEGRA, taping mode).